Activity
From 08/20/2022 to 08/29/2022
08/29/2022
08/28/2022
- 05:53 PM Feature #53 (Closed): 设定 Wafer Disposition
- 见帮助文档32页
双击 Wafer Disposition,进入良率阈值设定页面 - 05:44 PM Feature #52 (Closed): 增加Password进UserData数据库
- 见帮助文档59页
08/25/2022
- 08:56 PM Feature #51 (Closed): 右上角- 三色灯状态到退出
- 见帮助文档36页,先做界面,界面逻辑待做
- 08:50 PM Feature #50: 缺陷表的数据导入到数据库
- 研究下 BinCodeItems 是否能存入数据库?
public void LoadDefaultParameters()
{
BinCodeItems.Clear();... - 08:35 PM Feature #50 (Closed): 缺陷表的数据导入到数据库
08/22/2022
- 10:30 AM Feature #47 (Closed): coding
- 10:30 AM Feature #46 (Closed): design
- 10:29 AM Feature #32: datalog - 按钮点击和切换页面时写log
- 帮助文档第53页
Data Log 页面主要用于查看历史操作记录,以利异常故障分析判断定位 - 10:07 AM 环境支持 Feature #45 (Closed): 修复GD&T论坛的数据库,重建GD&T论坛
08/21/2022
- 06:35 PM Feature #5 (Resolved): dataGrid缺陷分类表(1)
- 06:32 PM Feature #30 (Resolved): 给任务按钮加一图片flag
- 06:28 PM Feature #31 (Resolved): design
- 04:59 PM Feature #32 (In Progress): datalog - 按钮点击和切换页面时写log
08/20/2022
- 05:31 PM Feature #14 (Resolved): Inspection Site:初始化检测区域按钮逻辑优化,需要根据Diemap界面的参数生成检测区域
- 05:27 PM Feature #39 (Resolved): test
- 05:25 PM Feature #12 (Resolved): DieMp:在执行save的时候将die的信息计算好,存入到recipe中
- 01:58 PM Feature #12: DieMp:在执行save的时候将die的信息计算好,存入到recipe中
- 根据晶圆尺寸判断,导入的map文件是否正确。
- 05:24 PM Feature #25 (Resolved): test
- 05:23 PM Feature #24 (Resolved): coding
- 10:04 AM Feature #24 (In Progress): coding
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